ContGD-G(AFM 探针)

Application: Contact Mode

 

Monolithic silicon AFM probe for contact mode and lateral force mode operation.

The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size.

For measurements in liquids please use the back side gold coated ContGD-G or the overall gold coated ContGB-G!


Coating

Gold coating on detector side of the cantilever, 70 nm thick

AFM Tip

SHAPE
Rotated
HEIGHT
17 µm 
(15 - 19 µm)*
SETBACK
15 µm 
(10 - 20 µm)*
RADIUS
< 10 nm
HALF CONE ANGLE
20°-25° along cantilever axis25°-30° from side10° at the apex

 

 

AFM Cantilever

Cantilever A
 Beam
 0.2 N/m (0.07 - 0.4 N/m)*
 13 kHz (9 - 17 kHz)*
 450 µm (440 - 460 µm)*
 50 µm (45 - 55 µm)*
 2 µm (1 - 3 µm)*
说明 档案大小 下载
budgetsensors 探针型录 123KB
型号 概述 询价数量