Tap300GB-G

Application: Tapping Mode, Intermittent Contact Mode

 

Monolithic silicon AFM probe for high frequency non-contact and tapping mode operation.

The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size.

Not recommended for electric applications on abrasive sample surfaces!


Coating

Overall gold coating, 70 nm thick

AFM Tip

SHAPE
Rotated
HEIGHT
17 µm 
(15 - 19 µm)*
SETBACK
15 µm 
(10 - 20 µm)*
RADIUS
< 10 nm
HALF CONE ANGLE
20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

AFM Cantilever

Cantilever A
 Beam
 40 N/m (20 - 75 N/m)*
 300 kHz (200 - 400 kHz)*
 125 µm (115 - 135 µm)*
 30 µm (25 - 35 µm)*
 4 µm (3 - 5 µm)*
说明 档案大小 下载
123KB
型号 概述 询价数量