NANOMECHANICS PROBES(AFM 探针)

这些尖端专为高机械负载和划痕测试应用而设计。 通过使用耐磨金刚石和宽锥角,可以很好地表征接触尺寸并在重复机械测量期间保持恒定。 这些探针已经证明在熔融石英和不锈钢等材料中具有高度可重复的深度(~100nm)压痕,并且可以使用相同的探针在原位以高分辨率对压痕进行成像。 在悬臂的检测器侧沉积金反射涂层以提高反射率。
 
纳米力学模式:PeakForce-QNM™、AMFM 模式、接触共振、QI™ 模式、PinPoint™ 纳米力学模式、HybriD 模式™、纳米压痕、划痕测试、断层扫描


 

NANOMECHANICS

These tips are specifically designed for high mechanical loads and scratch testing applications. By using wear-resistant diamond and a broad cone angle the contact size is well characterized and stays constant during repeated mechanical measurements. These probes are designed for nanoindenation and induce high levels of plastic deformation which allows hem to be used with Oliver-Pharr analysis to measure both the modulus and hardness of materials. These probes have demonstrated highly repeatable deep (~100nm) indentations in fused silica. The high resolution tip apex enables in-situ imaging of indents using the same probe.

 

cone.png
NANOMECHANICS- ADAMA TIP SPECS.png
  • Highly doped with boron with a macroscopic resistivity of 0.003 - 0.005 Ohm∙cm.

  • A gold reflex coating deposited on the detector side of the cantilever to enhance reflectivity.

 

NM-RC.png
NM-TC.png

Minimum quantity: 5.

Volume discounts:
20-pack = 5 % 50-pack = 10 %

Probes are always shipped as 5 probes per box.

说明 档案大小 下载
型号 概述 询价数量