The high resonance frequency with 1.6 MHz (Nominal) enables fast scanning measurement.
It can achieve to save your time of AFM data acquisition.
*For the use of OmegaLever, bandwidth with 2.5 MHz or above is required for the SPM sensor circuit.
X line scanning 20 Hz
Kraton (SEBS) sample courtesy of Wendy van Zoelen and Rachel Segalman, UC Berkeley.
Topography and Phase imaged with Cypher AFM courtesy of Asylum Research
2. Low thermal noise vibration for unprecedented resolution
It's low thermal noise of cantilever vibration enables high resolution measurement, which attributed to its high resonance frequency and high spring constant. It is worth while trying material research such as liquid-solid interface measurement.
The probe can be easily positioned at the exact point of your interest due to ‘Tip View’ structure.
The probe is located at the exact end of the cantilever so that the probe apex is not obscured during optical observations.
5. Reflex side gold coating
Thin gold film with the thickness of 70 nm is coated on the cantilever for reflecting light from the deflection sensor in the AFM equipment. High reflex for high S/N sensing can be expected