|Probe apex||Silicon (N type doped)|
|Lever||Silicon (N type doped)|
|type||New Concept Silicon Chip|
|Length × Width × Thickness
Lchip × Wchip × Tchip
*1 Positive value of 'Probe setback' means the probe apex extends even further than the apex of the cantilever.
Negative value means that the probe apex locates over the cantilever.
*2 Effective probe length (Effective tip height) is defined as a length of distal part from the cantilever of two stage structured probe
to clarify the length of the actual probe which smoothly grow in diameter from the probe apex toward the bottom.
*3 Specifications are subject to change without any obligation on the part of the manufacturer.