ACCESS Tip-View Probes(AFM 探针)
- Contact mode
- Force modulation
- Tapping™/Non-contact
- Conductive- PtIr
- Conductive- Gold
- Conductive- DD
ACCESS (TIP VIEW) PROBES
- Sharp silicon probes that allow a direct visualization of the AFM tip as it engages the sample surface
- Nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging
- Several variations to suit different modes of AFM and special applications like EFM
- Uncoated/gold coated (reflex side) probes are suitable for applications in air/liquid
- Uncoated/aluminum coated (reflex side) probes are suitable for applications in air
- Both sides gold coated (GG) probes are recommended for functionalization/non-contact electric force microscopy studies like Electrostatic Force Microscopy/KPFM etc.
- Platinum-Iridium (Pt-Ir) coated probes are recommended for contact EFM as well as PFM, KPFM etc.,
- Doped Diamond (DD) probes are ideal choice for Contact as well as Tapping™ electrical force microscopy applications like SSRM, PFM, EFM, KPFM etc.
| Cantilever Specs. * |
| k (N/m) |
0.3 |
| f (kHz) |
16 |
| Length (μm) |
450 |
| Width (μm) |
49 |
| Thickness (μm) |
2.5 |
| Coating (reflex side) |
None/Al |
| Special option |
Au |
| Tip specs. * |
| ROC (nm) |
<10 |
| Height (μm) |
14-16 |
| Shape |
Triangular |
| Coating |
Uncoated |
- Optimized for Force modulation mode imaging applications
| Cantilever Specs. * |
| k (N/m) |
2.7 |
| f (kHz) |
60 |
| Length (μm) |
245 |
| Width (μm) |
52 |
| Thickness (μm) |
2.8 |
| Coating (reflex side) |
None/Al |
| Special option |
Au (reflex side) |
| Tip specs. * |
| ROC (nm) |
<10 |
| Height (μm) |
14-16 |
| Shape |
Triangular |
| Coating |
Uncoated |
| Special option |
Au coating(GG) |
- Is designed for Tapping™/Non-contact mode applications
| Cantilever Specs. * |
| k (N/m) |
113 |
| f (kHz) |
330 |
| Length (μm) |
150 |
| Width (μm) |
54 |
| Thickness (μm) |
5.5 |
| Coating (reflex side) |
Al, None |
| Special option |
Au (reflex side) |
| Tip specs. * |
| ROC (nm) |
<10 |
| Height (μm) |
14-16 |
| Shape |
Triangular |
| Coating |
Uncoated |
| Special option |
Au coating (GG) |
- Series of probes coated with platinum-iridium (Pt-Ir) on different cantilevers for contact, force modulation and Tapping™/Non-contact mode EFM applications.
| Cantilever Specs. * |
| k (N/m) |
2.7 |
| f (kHz) |
60 |
| Length (μm) |
245 |
| Width (μm) |
52 |
| Thickness (µm) |
2.8 |
| Coating |
Pt-Ir |
| Tip specs. * |
| ROC (nm) |
<10 |
| Height (μm) |
14-16 |
| Shape |
Triangular |
| Coating |
Pt-Ir |
- Gold coated probes with excellent conductivity and chemical stability, designed for non-contact electrical studies like EFM, KPFM etc.
| Cantilever Specs. * |
| k (N/m) |
2.7 |
| f (kHz) |
60 |
| Length (μm) |
245 |
| Width (μm) |
52 |
| Thickness (µm) |
2.8 |
| Coating |
Au |
| Tip specs. * |
| ROC (nm) |
30 |
| Height (μm) |
14-16 |
| Shape |
Triangular |
| Coating |
Au |
- Gold coated probe on Tapping/Non-contact mode cantilever for non-contact electrical studies like EFM, KPFM etc.
| Cantilever Specs. * |
| k (N/m) |
113 |
| f (kHz) |
330 |
| Length (μm) |
150 |
| Width (μm) |
54 |
| Thickness (µm) |
5.5 |
| Coating |
Au |
| Tip specs. * |
| ROC (nm) |
30 |
| Height (μm) |
14-16 |
| Shape |
Triangular |
| Coating |
Au |
