Silicon Probes

Both cantilever & tip are Si

SILICON NITRIDE PROBES

SiN cantilever with Si or SiN tip

ACCESS Tip-View Probes

Allows direct view of the tip as it images the sample

Conductive Probes

Conductive probes for EFM, MFM

QUANTITATIVE FORCE SPECTROSCOPY

Quantitative force spectroscopy

High Aspect Ratio Tip (HART)

Deep trench metrology

STM Products

AppNano also offers high quality STM probes and STM tip etcher.