Both cantilever & tip are Si
SiN cantilever with Si or SiN tip
Allows direct view of the tip as it images the sample
Conductive probes for EFM, MFM
Quantitative force spectroscopy
Deep trench metrology
AppNano also offers high quality STM probes and STM tip etcher.
AppNano ACCESS™-NC-GG probes are sharp silicon probes for tapping / non-contact mode applications that allow a direct optical view of the AFM tip and designed for applications that require seeing the tip as it engages the surface. These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging. Reflex and tip sides are coated with gold.