AppNano-AFM

AppNano-AFM 原子力显微镜探针

Silicon Probes

Both cantilever & tip are Si

SILICON NITRIDE PROBES

SiN cantilever with Si or SiN tip

ACCESS Tip-View Probes

Allows direct view of the tip as it images the sample

Conductive Probes

Conductive probes for EFM, MFM

QUANTITATIVE FORCE SPECTROSCOPY

Quantitative force spectroscopy

High Aspect Ratio Tip (HART)

Deep trench metrology

STM Products

AppNano also offers high quality STM probes and STM tip etcher.

SICONGG

此款有10支装、20支装、50支装、200支装、410支-424支装(wafer)

NITRA-TALL-R-G

常用包装数量10支装、20支装、50支装

ACCESS-NC-GG

AppNano ACCESS™-NC-GG probes are sharp silicon probes for tapping / non-contact mode applications that allow a direct optical view of the AFM tip and designed for applications that require seeing the tip as it engages the surface. These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging. Reflex and tip sides are coated with gold.