OMCL-AC55TS

K=1600kHz F=85N/m
Tapping, Air

OMCL-AC160TS

K=300kHz F=26.0N/m
Tapping, Air

OMCL-AC160TN

K=300kHz F=26.0N/m
Tapping, Air, non-coating

OMCL-AC200TS

K=150kHz F=9N/m
Tapping, Air

OMCL-AC200TN

K=150kHz F=9N/m
Tapping, Air, non-coating

OMCL-AC240TS

K=70kHz F=2N/m
Soft Tapping, Air

OMCL-AC240TN

K=70kHz F=2N/m
Soft Tapping, Air, non-coating

AppNano-AFM

AppNano-AFM 原子力显微镜探针

Silicon Probes

Both cantilever & tip are Si

SILICON NITRIDE PROBES

SiN cantilever with Si or SiN tip

ACCESS Tip-View Probes

Allows direct view of the tip as it images the sample

Conductive Probes

Conductive probes for EFM, MFM