MagneticMulti75-G(AFM 探针)
Application: Magnetic Force Microscopy (MFM)
Monolithic silicon AFM probe for magnetic force microscopy (MFM). The cobalt alloy coated tip has a magnetic moment of roughly 10^-13 emu and coercivity of roughly 300 Oe.
The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.
The AFM holder chip fits most commercial AFM systems as it is industry standard size.
Coating
Hard magnetic, medium momentum coating on tip side of the cantilever and aluminium reflex coating on detector side of the cantilever
AFM Tip
SHAPE
Rotated
HEIGHT
17 µm
(15 - 19 µm)*
(15 - 19 µm)*
SETBACK
15 µm
(10 - 20 µm)*
(10 - 20 µm)*
RADIUS
< 60 nm
HALF CONE ANGLE
20°-25° along cantilever axis, 25°-30° from side, 10° at the apex
AFM Cantilever
Cantilever A
Beam
3 N/m (1 - 7 N/m)*
75 kHz (60 - 90 kHz)*
225 µm (215 - 235 µm)*
28 µm (23 - 33 µm)*
3 µm (2 - 4 µm)*
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