PMCL-AC200TSA

OUTSTANDING FEATURES

1. Mid-range spring constant for the measurements of soft samples
2. Measuring surface potential with low resistivity silicon (Common features in new silicon cantilever series)
3. Ideally point terminated probe
4. Acclaimed ‘TipView’ structure
5. Reflex side aluminum coating
6. Ease in chip handling
7. Packaging: Pre-separated chips

MORE ABOUT PMCL-AC200TSA SERIES

1. Mid-range spring constant for the measurements of soft samples
   Spring constant of 9 N/m(Typ.) is suitable for observing surface topography and viscoelasticity of soft samples. 
2. Measuring surface potential with low resistivity silicon
   Cantilever base material employs N-type doped silicon with a surface resistance of 0.01-0.02 Ω · cm (1/200th the surface resistance of our other base materials). This can be achieved to use for measuring surface potential and other applications.
3. Ideally point terminated probe
   The apex of the tetrahedral probe is ideally point terminated. The tetrahedral probe shows good symmetry viewed from the front.
4. Acclaimed ‘TipView’ structure
   The probe can be easily positioned at the exact point of your interest due to ‘TipView’ structure.
   The probe is located at the exact end of the cantilever so that the probe apex is not obscured during optical observations.
   
5. Reflex side goldcoating
   Thin gold (Au) film with the thickness of 50 nm is coated on the cantilever for reflecting light from the deflection sensor in the AFM equipment. High reflex for high S/N sensing can be expected.
6. Ease in chip handling
   The ideally vertical side-walls of the chip make tweezing easy and eliminate problems with chipping and debris.
7. Packaging: Pre-separated chips