Medium And Stiffer Middle Silicon Probe
| Model | Coating Metal (Tip side / Reflex) |
| PMCL-AC160TS | Non / Al |
| PARAMETER | PMCL-AC160TS | |
| Cantilever | Shape | Rectangular |
| Dimensions (LxWxT, µm) | 160 x 40 x 3.7 | |
| Resonance frequency (kHz) | 300 (±100) | |
| Spring constant (N/m) | 26 (typ.) | |
| Material | Silicon (n-type, 0.01 – 0.02 Ω·cm) | |
| Tip | Shape | Sharpened tetrahedral, 'Tip View' |
| Tip radius (nm) | 7 (typ.) | |
| Angles (F / B / S) | 0° / 35° / 9° or less | |
| Material | Silicon (n-type, 0.1 – 0.4 Ω·cm) | |
| Chip | Dimensions (mm) | 3.4 x 1.6 x 0.3 |
| Box | Configuration | Pre-separated / Tacky coating box |
Outstanding Features of Tetrahedral Cantilever
Application for various sample surfaces :
The stiffer middle mechanical properties [resonance frequency: 300 kHz, spring constant : 26 N/m] means that PMCL-AC160TS is redesigned for revealing sample surface precisely and gently.
Doped silicon cantilever :
The cantilever is made from silicon with a low surface resistance of 0.1 – 0.4 Ω・cm.
This means 1/20 resistance of our conventional cantilevers.
Tip
Below are SEM images of a Tetra tip from the front and side, and the last is a magnified view from side.
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Tip shape : sharpened tetrahedral ( tilted )
It shows good symmetry viewed from the front and is inclined viewed from the side.
Dimension of Levers and Chip (Substrates)
Metal Reflex Coating
Thin aluminum film with the thickness of 100 nm is coated on the cantilever for reflecting light from the deflection sensor in the AFM equipment. High reflex for high S/N sensing can be expected.
Packaging: Pre-separated chips
