25Pt400B(AFM 探针)
F= 10 kHz K= 8 N/m (AFM 探针)
12PtIr400B(AFM 探针)
F= 6 kHz K= 0.6 N/m (AFM 探针)
12Pt400B(AFM 探针)
F= 4.5 kHz K= 0.3 N/m (AFM 探针)
25PtIr300B(AFM 探针)
F= 21 kHz K= 22 N/m (AFM 探针)
25Pt300b(AFM 探针)
F= 20 kHz K= 18 N/m (AFM 探针)
12Pt300B(AFM 探针)
F= 9 kHz K= 0.8 N/m(AFM 探针)
25PtIr200B-H(AFM 探针)
F= 105 kHz K= 290 N/m (AFM 探针)
25Pt200B-H(AFM 探针)
F= 100 kHz K= 250 N/m (AFM 探针)
AppNano-AFM(AFM 探针)
AppNano-AFM 原子力显微镜探针(AFM 探针)
Silicon Probes(AFM 探针)
Both cantilever & tip are Si(AFM 探针)
SILICON NITRIDE PROBES(AFM 探针)
SiN cantilever with Si or SiN tip(AFM 探针)
ACCESS Tip-View Probes(AFM 探针)
Allows direct view of the tip as it images the sample(AFM 探针)