Soft Silicon Probe
| PARAMETER | PMCL-AC240TS | |
|---|---|---|
| Cantilever | Shape | Rectangular |
| Dimensions (LxWxT, µm) | 240 x 40 x 2.3 | |
| Resonance frequency (kHz) | 70 (±20) | |
| Spring constant (N/m) | 2 (typ.) | |
| Material | Silicon (n-type, 0.01 – 0.02 Ω·cm) | |
| Tip | Shape | Sharpened tetrahedral, 'Tip View' |
| Tip radius (nm) | 7 (typ.) | |
| Angles (F / B / S) | 0° / 35° / 9° or less | |
| Material | Silicon (n-type, 0.1 – 0.4 Ω·cm) | |
| Chip | Dimensions (mm) | 3.4 x 1.6 x 0.3 |
| Box | Configuration | Pre-separated / Tacky coating box |
Outstanding Features of Tetrahedral Cantilever
Small spring constant for the measurements of soft samples :
Spring constant of 2 N/m(Typ.) is the smallest in our silicon cantilevers for AC mode, suitable for observing surface topography and viscoelasticity of soft samples.
Measuring surface potential with low resistivity silicon :
Cantilever base material employs N-type doped silicon with a surface resistance of 0.01-0.02 Ω · cm (1/200th the surface resistance of our other base materials). This can be achieved to use for measuring surface potential and other applications.
Tip
Below are SEM images of a Tetra tip from the front and side, and the last is a magnified view from side.
.png)
Tip shape : sharpened tetrahedral ( tilted )
It shows good symmetry viewed from the front and is inclined viewed from the side.
Dimension of Levers and Chip (Substrates)
Metal Reflex Coating
Thin aluminum film with the thickness of 100 nm is coated on the cantilever for reflecting light from the deflection sensor in the AFM equipment. High reflex for high S/N sensing can be expected.
Packaging: Pre-separated chips
